DPI Seminar

Please join us for this exciting one hour seminar on Friday, May 9th at 11:00 a.m. to 12:00p.m in the DPI conference room.
Presenter: Jacqueline Yim, CBE GSA President, PhD Candidate
Title: Surface Modification of UHMW-PE fibers Using Atmospheric Plasma

Abstract:

Surface Modification of UHMW-PE fibers Using Atmospheric Plasma

J.H. Yim1, D. Pappas3, A. Fridman2, G.R. Palmese1

1Department of Chemical & Biological Engineering, Drexel University

2Drexel Plasma Institute, Drexel University

3Multifunctional Materials Branch, U.S. Army Research Laboratory

Ultra-high molecular weight polyethylene (UHMW-PE) fibers have been used as toughening agents in fiber-reinforced polymer composites for enhanced energy absorption and/or dissipation capabilities in ballistic materials. However, the limiting factor associated with these fibers is the poor adhesion with the polymer matrix at the interface. The lack of chemically active sites and the existence of low molecular weight species present on the surface of organic fibers contribute to the poor interfacial adhesion. Evidence of improved fiber-matrix adhesion via fiber surface treatments exists. These methods have shown to increase the wettability, induce surface roughening, and create chemically reactive sites for covalent bonding. In this work, we’ve investigated surface treatments that have been carried out by use of non-thermal atmospheric plasma to modify the surface properties of ultra-high molecular-weight polyethylene (UHMW-PE) fibers. Various plasmas – O2, N2, and a mixture of N2 and H2 were used. The intent of this investigation is to control the chemical groups and their concentration formed at the surface by varying treatment conditions. It was found that plasma was able to create polar reactive groups on the surfaces of the fibers. Results show that treatment conditions directly influence the degree of functionalization and surface morphology of the fibers. Chemical and physical changes were assessed using X-ray Photoelectron Spectroscopy (XPS) and Scanning Electron Microscopy (SEM).